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Proceedings Paper

The Measurement Of Conversion Noise In X-Ray Intensifying Screens
Author(s): David P. Trauernicht; Richard Van Metter
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Paper Abstract

A significant source of noise in screen-film radiography results from the variation in light output of the screen for absorption of x-rays of equal energy. Two methods are described in the literature for measuring the statistics of the number of light quanta emitted for each absorbed x-ray. The coincidence method registers x-ray events by detecting temporally correlated light quanta. It is limited in its ability to see events having a small number of quanta and can be biased by non-Poisson photomultiplier dark events. The pulse height method uses pulse shaping to produce pulses whose height is proportional to the number of quanta. In this case small pulses may be lost in order to discriminate against photomultiplier dark counts. We present a new method, based on the synchronous detection of a chopped x-ray source, which has the potential to avoid these shortcomings. Analytical methods necessary to remove the effects of unwanted x-ray energy components (such as backscatter radiation from our x-ray fluorescent targets) are discussed which provide stable estimates of the first and second moments of the light emission statistics. The method is then used to obtain a new set of measurements of the light emission statistics (including the mean light output and Swank I factor) for samples of Kodak Lanex x-ray intensifying screens for mean incident x-ray energies of 14.4, 17.8, 27.9, 35.2, 42.1, 49.8, and 59.6 keV.

Paper Details

Date Published: 27 June 1988
PDF: 17 pages
Proc. SPIE 0914, Medical Imaging II, (27 June 1988); doi: 10.1117/12.968622
Show Author Affiliations
David P. Trauernicht, Eastman Kodak Company (United States)
Richard Van Metter, Eastman Kodak Company (United States)


Published in SPIE Proceedings Vol. 0914:
Medical Imaging II
Samuel J. Dwyer; Roger H. Schneider; Roger H. Schneider; Samuel J. Dwyer; Samuel J. Dwyer; Roger H. Schneider, Editor(s)

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