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Proceedings Paper

Face recognition using improved local line binary pattern
Author(s): Wuh Shing Chai; Bakhtiar Affendi Rosdi; Shahrel Azmin Suandi
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Paper Abstract

This paper presents a new technique, named Improved Local Line Binary Pattern (ILLBP), which is an operator for illumination-robust face recognition from a single training image. In order to empirically demonstrate effectiveness of the proposed approach, we use Principal Component Analysis-Nearest Neighbour (PCA-NN) and multi-class Support Vector Machine (SVM) as the classifiers. Comparisons to the Local Line Binary Pattern (LLBP) on Yale Face Database B are also conducted. The advantages of our technique include higher accuracy, lesser complexity and faster computational time compared to LLBP technique.

Paper Details

Date Published: 8 June 2012
PDF: 6 pages
Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 833445 (8 June 2012); doi: 10.1117/12.968566
Show Author Affiliations
Wuh Shing Chai, Univ. Sains Malaysia (Malaysia)
Bakhtiar Affendi Rosdi, Univ. Sains Malaysia (Malaysia)
Shahrel Azmin Suandi, Univ. Sains Malaysia (Malaysia)


Published in SPIE Proceedings Vol. 8334:
Fourth International Conference on Digital Image Processing (ICDIP 2012)
Mohamed Othman; Sukumar Senthilkumar; Xie Yi, Editor(s)

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