Share Email Print
cover

Proceedings Paper

High-Power Semiconductor Diode Lasers : Reliability Data And Lifetest Methodology
Author(s): Dilip K. Paul
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper summarizes the development of high-power semiconductor diode lasers. Both structural and material considerations, and lifetest methodology appropriate for the high power devices are discussed. Also included are the lifetest data of representative state-of-the-art high-power diode lasers.

Paper Details

Date Published: 1 January 1987
PDF: 9 pages
Proc. SPIE 0842, Fiber Optics Reliability: Benign and Adverse Environments, (1 January 1987); doi: 10.1117/12.968180
Show Author Affiliations
Dilip K. Paul, COMSAT Laboratories (United States)


Published in SPIE Proceedings Vol. 0842:
Fiber Optics Reliability: Benign and Adverse Environments
Dilip K. Paul, Editor(s)

© SPIE. Terms of Use
Back to Top