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Proceedings Paper

La Diffraction X Instantanee Flash X-Ray Diffraction
Author(s): Francis Jamet
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Paper Abstract

We present a paper giving a survey about Flash X-Ray Diffraction (FXD) and its progress during the last years. After a brief introduction and a historical survey we determine how to improve flash X-ray systems in order to use them for FXD. A first possibility for increasing the emitted radiation by flash X-ray tubes is to in-crease the voltage. Some authors were successful in applying this method to the recording of powder patterns using 300 kV, 10 ns, pulses. Another possibility for increasing the emitted intensity without increasing the voltage is to use a pulse generator with a very low self-inductance, for example a Blumlein line, which enables attainment of a high discharge current. Finally it should be noted that the intensity of the X-rays falling on the sample can be in-creased by an appropriate shape of the anode in order to keep the focus very small 1,5 mm in diameter). The sensitivity of the detector can be appreciably improved by using highly sensitive films together with fluorescent screens. Another method is to use an image intensifier or a microchannel plate. FXD has been applied to the analysis of the evolution of different kinds of patterns (Laue, Debye-Scherrer,...) of cristals submitted to high deformation rates. We give examples of such rapid changes in the crystalline state due to exploding foils, shock waves or shaped charge effects.

Paper Details

Date Published: 1 February 1985
PDF: 7 pages
Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); doi: 10.1117/12.967901
Show Author Affiliations
Francis Jamet, Institut franco-allemand de recherches de Saint-Louis (France)


Published in SPIE Proceedings Vol. 0491:
16th Intl Congress on High Speed Photography and Photonics
Michel L. Andre; Manfred Hugenschmidt, Editor(s)

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