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Proceedings Paper

Visualization Of Stress Waves In Flawed Solids With A Multilaser Camera
Author(s): R. J. Sanford; R. G. Hughes
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Paper Abstract

Because stress-waves interacting with a flaw are not only diffracted and reflected but also converted from one type of wave into another (mode converted), it is very difficult in many cases to identify the source or propagation direction of a particular wave with an ultrasonic transducer. Visualization of the stress-wave flaw interaction provides a technique whereby the time history of the interaction can be observed and the resulting wave shapes, direction of propagation and nature of mode conversion identified. The visualization method used in our study is photoelastic visualization. Although earlier studies have used a similar visualization technique, the camera systems used lacked sufficient dynamic resolution in the image plane to enable identification of the waveform and spatial stress distribution after the interaction of the incident stress-wave with a flaw. In this study we show stress distributions in propagating stress waves and mode converted waves in transparent solids using a high-speed, multi-laser camera system. The camera system light sources consist of six ruby lasers in contrast to spark-gap sources used in earlier studies. The lasers are operated in the Q-switched mode and provide an exposure time of 35 nanoseconds for each frame. The framing rate is controlled wit4 either a microprocessor or a set of passive digital delays over the range of 0 to 10' frames/sec. Light output from the lasers is directed to the camera system via optical fiber bundles. A Cranz-Schardin lens configuration is used to record images on a stationary film plane.

Paper Details

Date Published: 1 March 1983
PDF: 10 pages
Proc. SPIE 0348, 15th Intl Congress on High Speed Photography and Photonics, (1 March 1983); doi: 10.1117/12.967801
Show Author Affiliations
R. J. Sanford, Naval Research Laboratory (United States)
R. G. Hughes, Naval Research Laboratory (United States)

Published in SPIE Proceedings Vol. 0348:
15th Intl Congress on High Speed Photography and Photonics
Lincoln L. Endelman, Editor(s)

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