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Proceedings Paper

Dynamic Tests And Application Of The Electron-Optical Measuring System
Author(s): T. Hiruma; H. Ilida; E. Inuzuka; K. Kamiya; Y. Tsuchiya; A. M. Prokhorov; V. N. Platonov; V. E. Postovalov; Yu. N. Serdyuchenko; M. Ya. Schelev
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Paper Abstract

The basic and dynamic performances of the new Electron-Optical measuring system type EWE in conjunction with various laser applications are presented. The system consists of Electron-Optical streak camera which is sensitive in the spectral recion from 380 nm to 1100 nm, TV read-out device and microprocessor controlled frame memory. Main features of the developed system will be described. The limiting temporal resolution has been measured to be 1.4 ps at FWEM. The dynamic range Of 70 at the measured duration of 5 ps has been obtained.

Paper Details

Date Published: 1 March 1983
PDF: 5 pages
Proc. SPIE 0348, 15th Intl Congress on High Speed Photography and Photonics, (1 March 1983); doi: 10.1117/12.967730
Show Author Affiliations
T. Hiruma, Hamamatsu TV Co.,Ltd. (Japan)
H. Ilida, Hamamatsu TV Co.,Ltd. (Japan)
E. Inuzuka, Hamamatsu TV Co.,Ltd. (Japan)
K. Kamiya, Hamamatsu TV Co.,Ltd. (Japan)
Y. Tsuchiya, Hamamatsu TV Co.,Ltd. (Japan)
A. M. Prokhorov, P.N. Lebedev Physical Institute (USSR)
V. N. Platonov, P.N. Lebedev Physical Institute (USSR)
V. E. Postovalov, P.N. Lebedev Physical Institute (USSR)
Yu. N. Serdyuchenko, P.N. Lebedev Physical Institute (USSR)
M. Ya. Schelev, P.N. Lebedev Physical Institute (USSR)

Published in SPIE Proceedings Vol. 0348:
15th Intl Congress on High Speed Photography and Photonics
Lincoln L. Endelman, Editor(s)

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