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Proceedings Paper

Photodeflection Method Of Measurement Of Kerr-Type Nonlinearities In Materials
Author(s): M. Bertolotti; A. Ferrari; C. Sibilia; G. Suber; P. Jani; D . Apostol
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Paper Abstract

The Photothermal Deflection Technique is applied to the determination of thermal nonlinearity in samples of Corning-glasses doped with CdSxSel-x (color filter glasses).

Paper Details

Date Published: 1 January 1987
PDF: 3 pages
Proc. SPIE 0836, Optoelectronic Materials, Devices, Packaging, and Interconnects, (1 January 1987); doi: 10.1117/12.967533
Show Author Affiliations
M. Bertolotti, Universita'di Roma (Italy)
A. Ferrari, Universita'di Roma (Italy)
C. Sibilia, Universita'di Roma (Italy)
G. Suber, Fondazione Ugo Bordoni (Italy)
P. Jani, Central Institute of Physics (Hungary)
D . Apostol, Central Institute of Physics (Romania)


Published in SPIE Proceedings Vol. 0836:
Optoelectronic Materials, Devices, Packaging, and Interconnects
Theodore E. Batchman; Richard Franklin Carson; Robert L. Galawa; Henry J. Wojtunik, Editor(s)

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