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Proceedings Paper

Practical Reduction Of Instrument Signature In Near Specular Light Scatter Measurements
Author(s): Kyle A. Klicker; John C. Stover; Daniel R. Cheever; Fredrick M. Cady
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Paper Abstract

When measuring scattered light as an indication of component quality, the measurement device's own scatter and beam profile limit the minimum angle from specular at which scattered light from the test sample can be measured. The broader the focused specular beam, the more difficult it is to make measurements at low angles. It is of interest to limit system scatter and the instrument's beam profile (signature) when truing to make low angle scatter measurements.

Paper Details

Date Published: 1 January 1987
PDF: 8 pages
Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); doi: 10.1117/12.967470
Show Author Affiliations
Kyle A. Klicker, Toomay. Mathis & Associates, Inc. (United States)
John C. Stover, Toomay. Mathis & Associates, Inc. (United States)
Daniel R. Cheever, Toomay. Mathis & Associates, Inc. (United States)
Fredrick M. Cady, Toomay. Mathis & Associates, Inc. (United States)


Published in SPIE Proceedings Vol. 0818:
Current Developments in Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

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