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Proceedings Paper

Near-Angle Scattered Light From Binary Optics
Author(s): Douglas W. Ricks
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Paper Abstract

The angle-resolved scattering measurement is an important indication of the fabrication errors and manufacturing limitations in the emerging technology of binary optics. A simple instrument is described which is capable of measuring scattered light from 1 degree to 0.01 degrees or closer to the main transmitted beam, and down to levels of one-billionth of the peak intensity. Scatter measurements are reported for a binary optic and are compared to the power spectral density function determined by a WYKO profiler. It is found that the binary fabrication process has increased the near-angle scatter by about a factor of 30X the scatter from the smooth surface. The power spectral density measurement does not compare well with the scattering data.

Paper Details

Date Published: 1 January 1987
PDF: 8 pages
Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); doi: 10.1117/12.967438
Show Author Affiliations
Douglas W. Ricks, Naval Weapons Center (United States)


Published in SPIE Proceedings Vol. 0818:
Current Developments in Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

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