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Proceedings Paper

Tunable Resonant Scanners
Author(s): Jean I. Montagu
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Paper Abstract

The most attractive features of resonant scanners are high reliability and eternal life as well as extremely low wobble and jitter. Power consumption is also low, electronic drive is simple, and the device is capable of handling large beams. All of these features are delivered at a low cost in a small package. The resonant scanner's use in numerous high precision applications, however, has been limited because of the difficulty in controlling its phase and resonant frequency. This paper introduces the concept of tunable/controllable resonant scanners, discusses their features, and offers a number of tuning techniques. It describes two angular scanner designs and presents data on tunable range and life tests. It also reviews applications for these new tunable resonant scanners that preserve the desirable features of earlier models while removing the old problems with synchronization or time base flexibility. The three major types of raster scanning applications where the tunable resonant scanner may be of benefit are: 1. In systems with multiple time bases such as multiple scanner networks or with scanners keyed to a common clock (the line frequency or data source) or a machine with multiple resonant scanners. A typical application is image and text transmission, also a printer with a large data base where a buffer is uneconomical. 2. In systems sharing data processing or laser equipment for reasons of cost or capacity, typically multiple work station manufacturing processes or graphic processes. 3. In systems with extremely precise time bases where the frequency stability of conventional scanners cannot be relied upon.

Paper Details

Date Published: 1 January 1987
PDF: 6 pages
Proc. SPIE 0817, Optomechanical Systems Engineering, (1 January 1987); doi: 10.1117/12.967405
Show Author Affiliations
Jean I. Montagu, General Scanning Inc. (United States)

Published in SPIE Proceedings Vol. 0817:
Optomechanical Systems Engineering
Daniel Vukobratovich, Editor(s)

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