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Proceedings Paper

Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
Author(s): M. S. Sthel; J. J. Lunazzi; E. N. Hogert; N. G. Gaggioli
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Paper Abstract

The absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3).

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967396
Show Author Affiliations
M. S. Sthel, Universidade Estadual de Camninas (Brazil)
J. J. Lunazzi, Universidade Estadual de Camninas (Brazil)
E. N. Hogert, Instituto Nacional de Tecnologia Industrial (Argentina)
N. G. Gaggioli, Instituto Nacional de Tecnologia Industrial (Argentina)

Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age
Henri H. Arsenault, Editor(s)

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