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Proceedings Paper

The Application Of Spatial Light Modulators To Real-Time Opto-Electronic Inspection Of Manufactured Glass Jars
Author(s): R. Cormack; K. M. Johnson; W. T. Cathey; F. Dolder
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Paper Abstract

Defects in machine-blown glassware, known as stuck glass, are caused by flying glass particles falling into red-hot bottles on an assembly line during manufacturing. These defects can potentially become dislodged when removing food from the glass container. Current inspection machines easily locate gross defects which are larger than the mold marks and lettering on the bottom of glass jars. Inspection of smaller defects, on the order of several mm, is generally performed manually. In this paper we present a real-time opto-electronic inspection machine which uses successfully images small glass defects while suppressing the image of the jar.

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967372
Show Author Affiliations
R. Cormack, University of Colorado at Boulder (United States)
K. M. Johnson, University of Colorado at Boulder (United States)
W. T. Cathey, University of Colorado at Boulder (United States)
F. Dolder, Ball Electronic Systems Division (United States)


Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age

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