Proceedings PaperPhase Visualization Of Diffraction Patterns And Its Application
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In non-contact particle characterization in-line holography has played an important role. There are two methods for obtaining the information of particles, one is the optical reconstruction of real images and another is the calculation from the photographic recording of diffraction patterns. In the former, errors are introduced by focusing error, the nonlinearity of the recording media, aberration, etc. In the latter, from the diffraction patterns containing shape, size and position information it is difficult to extract each separately and the accurate measurement of light intensity data from the photographic record of diffraction patterns is also difficult.