Share Email Print
cover

Proceedings Paper

Phase Visualization Of Diffraction Patterns And Its Application
Author(s): Motoki Yonemura
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In non-contact particle characterization in-line holography has played an important role. There are two methods for obtaining the information of particles, one is the optical reconstruction of real images and another is the calculation from the photographic recording of diffraction patterns. In the former, errors are introduced by focusing error, the nonlinearity of the recording media, aberration, etc. In the latter, from the diffraction patterns containing shape, size and position information it is difficult to extract each separately and the accurate measurement of light intensity data from the photographic record of diffraction patterns is also difficult.

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967322
Show Author Affiliations
Motoki Yonemura, Yamanashi University (Japan)


Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age

© SPIE. Terms of Use
Back to Top