Share Email Print
cover

Proceedings Paper

Automated Optical Testing
Author(s): H. J. Tiziani
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Interferometry, holographic interferometry and speckle techniques are becoming useful tools for precision measurements in research and for industrial applications. Computer analysis ist increasingly important for the fringe analysis. The use of solid state detector-arrays, image memory boards together with microprocessors and computers for the extraction of the information from the interferograms and high resolution graphic boards find important application in optical metrology. Much more information can be extracted from the interferograms leading to higher sensitivities and accuracies.

Paper Details

Date Published: 1 January 1987
PDF: 4 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967293
Show Author Affiliations
H. J. Tiziani, University of Stuttgart (Germany)


Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age

© SPIE. Terms of Use
Back to Top