Proceedings PaperAutomated Optical Testing
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Interferometry, holographic interferometry and speckle techniques are becoming useful tools for precision measurements in research and for industrial applications. Computer analysis ist increasingly important for the fringe analysis. The use of solid state detector-arrays, image memory boards together with microprocessors and computers for the extraction of the information from the interferograms and high resolution graphic boards find important application in optical metrology. Much more information can be extracted from the interferograms leading to higher sensitivities and accuracies.