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Proceedings Paper

Statistical-Image-Surface Conception In Analysis Of Electrostatic Electron-Optical Imaging Systems
Author(s): J. M. Woznicki
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Paper Abstract

Progress of computational methods in electron optics makes possible to determine focusing properties of real electron-optical systems by means of electron trajectories analysis (e.g.U] ). These problems have essential practical meaning in optics in general. For real optical systems the rays method of the image properties analysis seems to be useful.

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967278
Show Author Affiliations
J. M. Woznicki, Warsaw University (Poland)


Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age

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