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Proceedings Paper

A New Parameter In The ATR Technique For Optical Constants Determination
Author(s): L. E. Regalado; R. Machorro
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Paper Abstract

The Attenuated Total Reflection (ATR) method has shown to be a powerful tool for optical characterization of metal surfaces /1/. The effect of a double interface /2/ and the modification of surface electromagnetic waves (SEW) by very thin layers /3/ have also been studied using this technique.

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967231
Show Author Affiliations
L. E. Regalado, Instituto Nacional de Astrofisica, Optica y Electronica (United States)
R. Machorro, Instituto Nacional de Astrofisica, Optica y Electronica (United States)


Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age
Henri H. Arsenault, Editor(s)

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