Share Email Print

Proceedings Paper

Power-Dependent Attenuation And Power Transfer Effects In Optical Nonlinear Waveguides
Author(s): Z. Jakubczyk; H. Jerominek; S. Patela; R. Tremblay; C. Delisle
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a theoretical analysis of some new properties of TE waves in waveguides consisting of an optical linear thin film deposited onto the surface of a substrate exhibiting both positive and negative nonlinearities at two different wavelengths. The semi-infinite substrate is characterized by an intensity dependent refractive index ns= nso+ n2S, where S is the local power density and n2 is the nonlinear coefficient. The data set used in our calculations concerns a particular structure consisting of a film of Corning 7059 glass deposited onto the surface of a Schott GG 495 glass filter. Color filters made with glasses doped with crystallites of the mixed semiconductor CdSxSel_x exhibit third order nonlinearity with n2 of about 10-14m2/W. It is also known1 that the sign of the nonlinearity in these glasses changes in the vicinity of a band gap. The material parameters for positive nonlinearity at λ = 0.4765 pm and negative nonlinearity at λ= 0.4880 mm are the following: Corning glass film refractive indices nf= 1.597 and 1.595; substrate refractive indices nse 1.573 and 1.569; imaginary parts of dielectric constant of the substrate c" = 2.8 x 10 and 6.5 x 10-5 respectively.

Paper Details

Date Published: 1 January 1987
PDF: 2 pages
Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967207
Show Author Affiliations
Z. Jakubczyk, Universite Laval (Canada)
H. Jerominek, Universite Laval (Canada)
S. Patela, Universite Laval (Canada)
R. Tremblay, Universite Laval (Canada)
C. Delisle, Universite Laval (Canada)

Published in SPIE Proceedings Vol. 0813:
Optics and the Information Age

© SPIE. Terms of Use
Back to Top