Share Email Print

Proceedings Paper

In-Process Measurement Of Surface Texture
Author(s): Lionel R Baker; John K Myler
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The process of single point generation of a surface, although convenient for the manufacture of aspherical surfaces without apparently the need for final polishing, usually results however in some residual surface texture. The effect of polishing defects, such as roughness and flaws, on the quality of different optical systems is reviewed and discussed in order to illustrate the significance of residual texture in terms of perceived quality and function. Different methods for in-process measurement of texture are described, together with results recently obtained on the measurement of turned surfaces at various stages of tool wear.

Paper Details

Date Published: 1 January 1987
PDF: 7 pages
Proc. SPIE 0802, In-Process Optical Metrology for Precision Machining, (1 January 1987); doi: 10.1117/12.967115
Show Author Affiliations
Lionel R Baker, Sira Ltd (United Kingdom)
John K Myler, British Aerospace (United Kingdom)

Published in SPIE Proceedings Vol. 0802:
In-Process Optical Metrology for Precision Machining
Peter Langenbeck, Editor(s)

© SPIE. Terms of Use
Back to Top