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Proceedings Paper

Definition And Implementation Of A Thermal Vacuum Bakeout Program For The Hubble Space Telescope
Author(s): J. M. Steakley; P. Glassford; R. A. Osiecki; D. J. Tenerelli; L. A. Burdick; S. J. Housten; A. E. Hultquist
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Paper Abstract

Molecular outgassing from spacecraft nonmetallic materials and surface contaminants can greatly affect optical surfaces if such outgassing sources condense onto the critical surfaces. Thermal vacuum bakeout of spacecraft hardware has proven to be an effective method of outgassing flight materials and depleting contaminant hydrocarbons from hardware associated with critical optical systems. This paper describes the thermal vacuum bakeout program used for the Hubble Space Telescope components at Lockheed Missiles & Space Co. (LMSC) prior to their integration with the telescope primary and secondary mirrors. Rationale for adopting a bakeout program from experimental data and analytical modelling are presented in this paper. Development of criteria based on telescope performance requirements is discussed. Selection of appropriate bakeout instrumentation and location, including Temperature-controlled Quartz Crystal Microbalance sensors and Residual Gas Analyzer, is described. The development of chamber cleaning and verification techniques plus chamber operational controls are shown to be a crucial part of the bakeout program. Outgassing curves for the five major subassemblies designed and fabricated at LMSC are included to demonstrate the effectiveness of the thermal vacuum bakeout program.

Paper Details

Date Published: 1 January 1987
PDF: 6 pages
Proc. SPIE 0777, Optical Systems Contamination: Effects, Measurement, Control, (1 January 1987); doi: 10.1117/12.967085
Show Author Affiliations
J. M. Steakley, Lockheed Missiles & Space Company, Inc. (United States)
P. Glassford, Lockheed Missiles & Space Company, Inc. (United States)
R. A. Osiecki, Lockheed Missiles & Space Company, Inc. (United States)
D. J. Tenerelli, Lockheed Missiles & Space Company, Inc. (United States)
L. A. Burdick, Lockheed Missiles & Space Company, Inc. (United States)
S. J. Housten, Lockheed Missiles & Space Company, Inc. (United States)
A. E. Hultquist, Lockheed Missiles & Space Company, Inc. (United States)


Published in SPIE Proceedings Vol. 0777:
Optical Systems Contamination: Effects, Measurement, Control
A. Peter M. Glassford, Editor(s)

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