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Proceedings Paper

A Comparative Review Of Optical Surface Contamination Assessment Techniques
Author(s): James B. Heaney
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Paper Abstract

This paper will review the relative sensitivities and practicalities of the common surface analytical methods that are used to detect and identify unwelcome adsorbants on optical surfaces. The compared methods include visual inspection, simple reflectometry and transmissiometry, ellipsometry, infrared absorption and attenuated total reflectance spectroscopy (ATR), Auger electron spectroscopy (AES), scanning electron microscopy (SEM), secondary ion mass spectrometry (SIMS), and mass accretion determined by quartz crystal microbalance (QCM). The discussion is biased toward those methods that apply optical thin film analytical techniques to spacecraft optical contamination problems. Examples are cited from both ground based and in-orbit experiments.

Paper Details

Date Published: 1 January 1987
PDF: 10 pages
Proc. SPIE 0777, Optical Systems Contamination: Effects, Measurement, Control, (1 January 1987); doi: 10.1117/12.967078
Show Author Affiliations
James B. Heaney, Goddard Space Flight Center (United States)

Published in SPIE Proceedings Vol. 0777:
Optical Systems Contamination: Effects, Measurement, Control
A. Peter M. Glassford, Editor(s)

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