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Proceedings Paper

Mapping GaAs Photoluminescence
Author(s): Raymond Kaminski
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Paper Abstract

Photoluminescence spectroscopy is one of the most effective methods for characterizing semiconductor materials like silicon, gallium arsenide or indium phosphide. This analytical technique supplies data that tells the researcher how well devices fabricated from a. particular material can be expected to perform. The information can then be used to optimize growing conditions or to reject a sample before additional processing. Such increases in, and stabilization of device yield are critical in a very competitive marketing environment.

Paper Details

Date Published: 1 January 1987
PDF: 10 pages
Proc. SPIE 0743, Fluorescence Detection, (1 January 1987); doi: 10.1117/12.966929
Show Author Affiliations
Raymond Kaminski, SFEX Industries, Inc. (United States)


Published in SPIE Proceedings Vol. 0743:
Fluorescence Detection
E. Roland Menzel, Editor(s)

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