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Proceedings Paper

Fluorescence Probes For Study Of Damage In Dielectrics
Author(s): E. R. Menzel; L. L. Hatfield; V. K. Agarwal; W. G. Linzey; J. D. Smith
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Paper Abstract

A novel approach to investigation of electrical damage in insulators is described. It involves the use of fluorescence probes that selectively stain the damage features of interest or that react at specific sites, changing their fluorescence characteristics. Because of the sensitivity laser excited fluorescence provides, surface flashover tracks, locations of corona discharge and other features are easily revealed even when no damage is discernible in room light. Our results show that structural features, charge distributions, and chemical changes caused by electrical damage may be probed. Some surprising features of insulator damage revealed by fluorescence probes are presented.

Paper Details

Date Published: 1 January 1987
PDF: 8 pages
Proc. SPIE 0743, Fluorescence Detection, (1 January 1987); doi: 10.1117/12.966927
Show Author Affiliations
E. R. Menzel, Texas Tech University (United States)
L. L. Hatfield, Texas Tech University (United States)
V. K. Agarwal, Texas Tech University (United States)
W. G. Linzey, Texas Tech University (United States)
J. D. Smith, Texas Tech University (United States)

Published in SPIE Proceedings Vol. 0743:
Fluorescence Detection
E. Roland Menzel, Editor(s)

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