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Proceedings Paper

Optical analyses of pulsed interferometric patterning of azo-polysiloxanes
Author(s): V. Damian; Ileana Apostol; N. Hurduc; Mihaela Bojan; C. Udrea
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Paper Abstract

Azo-polymeric materials present in the last decade a great interest due to their applications. Our materials are based on polysiloxanic chains, modified with different azo-benzenic groups. This new class of hybrid polymer (organic/inorganic) gives a large potential of applications in biology, chemistry, sensors, microelectronics etc. Due to photo-chromic properties of the azo-polymers it is possible to apply two kinds of techniques for surface relief gratings (SRG) generation, necessary for using the polymers in enumerated applications: continuous or pulsed light irradiation. Our work was focused on SRG generation on azo-polymers by pulsed light irradiation, with a Lloyd interferometric set-up. The resulting structures were analyzed, from optical point of view, by three methods: white light interferometry (WLI), optical microscopy and diffraction efficiency. All determination has been done in correlations with the irradiation parameters: fluence and number of pulses. We can say that the pulsed radiation interferometric patterning of azo-polysiloxanes is an efficacy and controllable technology to obtain surface relief gratings very necessary for the biological applications (cell culture) and optical methods analyses are useful for rapid determinations.

Paper Details

Date Published: 1 November 2012
PDF: 6 pages
Proc. SPIE 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI, 841128 (1 November 2012); doi: 10.1117/12.966848
Show Author Affiliations
V. Damian, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Ileana Apostol, National Institute for Lasers, Plasma and Radiation Physics (Romania)
N. Hurduc, Technical Univ. of Iasi (Romania)
Mihaela Bojan, National Institute for Lasers, Plasma and Radiation Physics (Romania)
C. Udrea, National Institute for Lasers, Plasma and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 8411:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI
Paul Schiopu; Razvan Tamas, Editor(s)

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