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Proceedings Paper

Research on sensing characteristics of low-finesse fiber-optic Fabry-Perot cavity
Author(s): Jian-ghai Zhao; Xiao-dong Ye; Shao-min Sun; Lin-sen Xu
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Paper Abstract

The Low-Finesse Fabry-Perot(F-P) cavity, as a kind of fiber-optic sensor probe frequently used, can be applied to detect physical parameters of strain, temperature, acoustic wave, pressure, and so on, and is an important optical sensing component. In this paper, sensing properties of low-finesse F-P cavity is deeply and systemically analyzed. At first, the interference principle of F-P cavity is illuminated from three aspects which include the distribution of light power, the characteristic of interference fringe and the sensitivity. Considering the spectrum of incident beam obeys a Gaussian distribution, the intensity distribution of reflected beam is approximate to a cosine function within a Gaussian envelope and the visibility of interference fringes follows a Gaussian distribution also. Moreover, the operating point of low finesse F-P cavity must be held near the quadrature-point for the maximum sensitivity. The operating characteristic of FP cavity is analyzed from three aspects including linearity, property of temperature and contrast of fringe. Analyzing results show that the F-P cavity can offer the linearity of 2.2%, and the fringe contrast drops as the length of F-P cavity increases. In addition, the F-P cavity is insensitive to the change of environmental temperature and possesses an excellent capability to suppress the temperature disturbance. Finally, a test scheme is established to verify the sensor performance of F-P probe. Test results indicate that the F-P cavity offers the sensitivity of 7.5V/um and the measuring accuracy of 9.4nm, and can well satisfies the practical requirement.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841702 (15 October 2012); doi: 10.1117/12.966803
Show Author Affiliations
Jian-ghai Zhao, Hefei Institute of Physical Science (China)
Institute of Advanced Manufacturing Technology (China)
Xiao-dong Ye, Hefei Institute of Physical Science (China)
Institute of Advanced Manufacturing Technology (China)
Shao-min Sun, Hefei Institute of Physical Science (China)
Institute of Advanced Manufacturing Technology (China)
Lin-sen Xu, Hefei Institute of Physical Science (China)
Institute of Advanced Manufacturing Technology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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