Share Email Print

Proceedings Paper

Critical Review Of Recent Developments In Electronic Speckle Pattern Interferometry
Author(s): J. R. Tyrer
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) is now fifteen years old. What has held it back in its development? Some recent developments enabling ESPI to become a commercial instrument capable of solving specific industrial tasks will be discussed. The use of this instrument to assist both the opto-mechanical engineer and the experimental engineer to help solve problems raised at product design level as well as later when "fire fighting" pre-production and in- situ crisis that require very short investigative response times.

Paper Details

Date Published: 1 January 1986
PDF: 17 pages
Proc. SPIE 0604, Holographic Nondestructive Testing, (1 January 1986); doi: 10.1117/12.966617
Show Author Affiliations
J. R. Tyrer, Loughborough University of Technology (United Kingdom)

Published in SPIE Proceedings Vol. 0604:
Holographic Nondestructive Testing
Charles M. Vest, Editor(s)

© SPIE. Terms of Use
Back to Top