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Proceedings Paper

Quantitative Holographic Analysis Of Small Components
Author(s): Ryszard J. Pryputniewicz
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Paper Abstract

Methods of hologram interferometry are used to study load-deflection characteristics of small components. More specifically, fundamentals of the methods of double-exposure hologram interferometry, time average hologram interferometry, and heterodyne hologram interometry are discussed, procedures for quantitative interpretation of holograms are outlined, and their applications are illustrated by representative examples. Results presented in this paper indicate viability of the methods of hologram interferometry for quantitative studies of small components.

Paper Details

Date Published: 1 January 1986
PDF: 15 pages
Proc. SPIE 0604, Holographic Nondestructive Testing, (1 January 1986); doi: 10.1117/12.966615
Show Author Affiliations
Ryszard J. Pryputniewicz, Worcester Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 0604:
Holographic Nondestructive Testing
Charles M. Vest, Editor(s)

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