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Proceedings Paper

Charge Coupled Devices (CCDS) For X-Ray Spectroscopy Applications
Author(s): E. G. Chowanietz; D. H. Lumb; A. A. Wells
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Paper Abstract

The X-ray performance of two new types of GEC P8600 CCDs have been measured. One, a conventional thin depletion layer device, possesses very low noise characteristics enabling good X-ray energy resolution to be achieved, but with only modest quantum efficiency (10% at 5.9 keV). The other, a deep depletion device fabricated on high resistivity silicon also possesses the desired low noise performance (8 electrons rms), combined with much improved quantum efficiencies (60% at 5.9 keV). Degradation of energy resolution due to charge spreading effects has also been overcome through use of the deep depletion layer and the new device has a capability for rejection of background charged particles of around 96%. The development is for spectroscopic instrumentation for X-ray astronomy.

Paper Details

Date Published: 14 July 1986
PDF: 8 pages
Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); doi: 10.1117/12.966603
Show Author Affiliations
E. G. Chowanietz, Leicester University (United Kingdom)
D. H. Lumb, Leicester University (United Kingdom)
A. A. Wells, Leicester University (United Kingdom)

Published in SPIE Proceedings Vol. 0597:
X-Ray Instrumentation in Astronomy
J. Leonard Culhane, Editor(s)

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