Share Email Print
cover

Proceedings Paper

The Bragg Crystal Spectrometer for AXAF
Author(s): C. R. Canizares; T. H. Markert; G . W. Clark
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

MIT's High Resolution X-ray Spectroscopy investigation on AXkF involves two complementary dispersive instruments, a Bragg Crystal Spectrometer (BCS) and a High Energy Transmission Grating Spectrometer (HETGS). The overall goal of the investigation is to study the physical condtions in celestial sources by means of detailed measurements of their X-ray spectra. High spectral resolution measurements can be used to perform diagnostics of emitting and absorbing matter, leading to knowledge of temperature, ionization state, elemental abundance, density and optical depth.

Paper Details

Date Published: 14 July 1986
PDF: 12 pages
Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); doi: 10.1117/12.966588
Show Author Affiliations
C. R. Canizares, Massachusetts Institute of Technology (United States)
T. H. Markert, Massachusetts Institute of Technology (United States)
G . W. Clark, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0597:
X-Ray Instrumentation in Astronomy
J. Leonard Culhane, Editor(s)

© SPIE. Terms of Use
Back to Top