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Proceedings Paper

Correspondence Between AXAF TMA X-Ray Performance And Models Based Upon Mechanical And Visible Light Measurements
Author(s): L. Van Speybroeck; P. J. McKinnon; S. S. Murray; F. A. Primini; D. A. Schwartz; M. V. Zombeck; C. C. Dailey; J. C. Reily; M. C. Weisskopf; C. L. Wyman
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Paper Abstract

The AXAF Technology Mirror Assembly (TMA) was characterized prior to x-ray testing by properties measured mechanically or with visible light; these include alignment offsets, roundness and global axial slope errors, axial figure errors with characteristic lengths greater than about five mm, and surface roughness with scale lengths between about 0.005 and 0.5 mm. The x-ray data of Schwartz et al (1985) are compared with predictions based upon the mechanical and visible light measurements.

Paper Details

Date Published: 14 July 1986
PDF: 7 pages
Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); doi: 10.1117/12.966557
Show Author Affiliations
L. Van Speybroeck, Smithsonian Astrophysical Observatory (United States)
P. J. McKinnon, Smithsonian Astrophysical Observatory (USA) (United States)
S. S. Murray, Smithsonian Astrophysical Observatory (USA) (United States)
F. A. Primini, Smithsonian Astrophysical Observatory (USA) (United States)
D. A. Schwartz, Smithsonian Astrophysical Observatory (USA) (United States)
M. V. Zombeck, Smithsonian Astrophysical Observatory (USA) (United States)
C. C. Dailey, NASA Marshall Space Flight Center (USA) (United States)
J. C. Reily, NASA Marshall Space Flight Center (USA) (United States)
M. C. Weisskopf, NASA Marshall Space Flight Center (USA) (United States)
C. L. Wyman, NASA Marshall Space Flight Center (USA) (United States)


Published in SPIE Proceedings Vol. 0597:
X-Ray Instrumentation in Astronomy
J. Leonard Culhane, Editor(s)

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