Share Email Print
cover

Proceedings Paper

X-ray Testing of the AXAF Technology Mirror Assembly (TMA) Mirror
Author(s): D. A. Schwartz; P. J. McKinnon; S. S. Murray; F. A. Primini; L. P. Van Speybroeck; C. C. Dailey; J. C. Reily; M. C. Weisskopf
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We describe the X-ray performance of the AXAF TMA in the 0.277 to 6.4 keV range. We verify the precise figure and smooth surface originally specified, and which were expected from the in-process optical and mechanical measurements. This paper primarily describes the test equipment and methods used, and gives examples of the detailed on-axis and off-axis data we acquired.

Paper Details

Date Published: 14 July 1986
PDF: 10 pages
Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); doi: 10.1117/12.966556
Show Author Affiliations
D. A. Schwartz, Smithsonian Astrophysical Observatory (United States)
P. J. McKinnon, Smithsonian Astrophysical Observatory (United States)
S. S. Murray, Smithsonian Astrophysical Observatory (United States)
F. A. Primini, Smithsonian Astrophysical Observatory (United States)
L. P. Van Speybroeck, Smithsonian Astrophysical Observatory (United States)
C. C. Dailey, NASA/MSFC (United States)
J. C. Reily, NASA/MSFC (United States)
M. C. Weisskopf, NASA/MSFC (United States)


Published in SPIE Proceedings Vol. 0597:
X-Ray Instrumentation in Astronomy
J. Leonard Culhane, Editor(s)

© SPIE. Terms of Use
Back to Top