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Proceedings Paper

Study on MTF of remote sensing imaging under arbitrary known vibration
Author(s): Qin Deng; Huajun Feng; Zhihai Xu; Qi Li; Yueting Chen; Wende Dong
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Paper Abstract

Due to the vibration of satellite platform, the image degradation has greatly hindered the development of High Resolution Earth Observation (HREO) system. Modulation Transfer Function (MTF) is an effective means to measure the image quality, which can well quantitatively analyze the degradation of image quality as a result of satellite platform vibration. This paper is divided into 3 parts to systematically analyze how the vibration of satellite platform affects the image quality. Firstly, the basic law of satellite vibration is clarified, and the relationships between image displacements and the vibration of the space-borne camera in all six degrees of freedom (DOF) are detailed demonstrated. Secondly, the mechanism of optical degradation for remote starring imaging under vibration is analyzed, and then deriving from Optical Transform Function (OTF), a formula for calculating the MTF is identified for arbitrary known vibration. Finally, a properly designed semi-physical simulation system is built. Loading a certain vibration parameter as the vibration source, the system can get a simulated degraded image. The slanted-edge method for calculating MTF of image is introduced for comparison. Experiments show that the MTFs calculated from the derived MTF formula and obtained by slanted-edge method from the simulated degraded image present a good agreement, which verifies the reliability of the proposed theoretical analysis.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200W (15 October 2012); doi: 10.1117/12.966412
Show Author Affiliations
Qin Deng, Zhejiang Univ. (China)
Huajun Feng, Zhejiang Univ. (China)
Zhihai Xu, Zhejiang Univ. (China)
Qi Li, Zhejiang Univ. (China)
Yueting Chen, Zhejiang Univ. (China)
Wende Dong, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)

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