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Proceedings Paper

Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials
Author(s): Maciej Wielgus; Jakub Grochowski; Eliana Kamińska; Krzysztof Patorski
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Paper Abstract

We present a novel application of the continuous wavelet transform (CWT) for quantitative analysis of electron diffraction fringe patterns for material science research. With this method unsupervised analysis of large data sets can be performed, to determine statistical distribution of fringe periods, corresponding to the spacing between the planes in the atomic lattice. It is more robust and less time consuming than typical manual approach. Obtained information can be further utilized for characterization and identification of the crystallographic structures present in the sample. The proposed method is applied to analysis of high resolution transmission electron microscope (HRTEM) images of Iridium-Zinc-Silicon-Oxide thin films, which reveal nanocrystallic structures dispersed in an amorphous matrix.

Paper Details

Date Published: 1 November 2012
PDF: 6 pages
Proc. SPIE 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI, 84110A (1 November 2012); doi: 10.1117/12.966390
Show Author Affiliations
Maciej Wielgus, Institute of Electron Technology (Poland)
Institute of Micromechanics and Photonics (Poland)
Jakub Grochowski, Institute of Electron Technology (Poland)
Institute of Microelectronics and Optoelectronics (Poland)
Eliana Kamińska, Institute of Electron Technology (Poland)
Krzysztof Patorski, Institute of Micromechanics and Photonics (Poland)


Published in SPIE Proceedings Vol. 8411:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI
Paul Schiopu; Razvan Tamas, Editor(s)

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