Share Email Print
cover

Proceedings Paper

Autocorrelation diagnostics of phase singularities in diffracted optical fields
Author(s): Ch. V. Felde; M. V. Oleksyuk; P. V. Polyanskii; H. V. Bogatyryova
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The autocorrelation technique applied to diagnostics of phase singularities arising in diffraction patterns is presented for the first time. The proposed technique is based on the Young-Rubinowicz model of diffraction phenomena (model of the edge diffraction wave) and consists in analysis of bending or shift of interference fringes, which are produced by the waves from two edges of narrow opaque strip placed in the beam. This original approach has been applied previously for detection and diagnostics of optical vortices in Laguerre-Gaussian beams, in combined partially coherent/ partially polarized beams as well as in speckle fields. Here we show applicability of the same experimental approach for detecting another type of optical singularities, viz. edge (rather than screw) dislocations of optical wave fronts. Such technique is of especial importance when the use of separate reference wave (cross-correlation approach) is hampered due to incomplete spatial coherence of the analyzed beam or its complex polarization structure. We demonstrate practicability of the proposed technique with instructive examples of typical diffraction patters both in Fraunhofer and Fresnel zones. Besides, our experiments show structural stability of edge dislocations in diffraction patterns. Namely, if even amplitude zeroes are ‘hidden’, then autocorrelation technique provides detecting at least component singularity.

Paper Details

Date Published: 1 November 2012
PDF: 6 pages
Proc. SPIE 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI, 841109 (1 November 2012); doi: 10.1117/12.966373
Show Author Affiliations
Ch. V. Felde, Chernivtsi National Univ. (Ukraine)
M. V. Oleksyuk, Chernivtsi National Univ. (Ukraine)
P. V. Polyanskii, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
H. V. Bogatyryova, Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 8411:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI
Paul Schiopu; Razvan Tamas, Editor(s)

© SPIE. Terms of Use
Back to Top