Share Email Print
cover

Proceedings Paper

Automated Inspection Of Magnetic Media By Laser Scanning
Author(s): Pedro Lilienfeld; Sergey Broude; Eric Chase; George Quackenbos
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Two automated laser scanning systems have been developed for the rapid inspection of flexible and rigid magnetic recording disks. Surface defect characterization is performed by means of the detection of light scattering pulses produced by a wide range of surface or near-surface physical defects. These imperfections are highly correlated with magnetic defects associated with data drop-outs. In addition, surface irregularities can result in transient air bearing discontinuities which cause read/write data errors and head disk interference. The inspection systems described in this paper include complete robotic disk handling subsystems with computer control for all inspection parameters. The automated inspection process is performed within a self-contained clean-room environment to preclude disk contamination. Disks are classified and physically segregated into several "quality" groupings in accordance with user-selected criteria combining the number and size of defects. Complete disk inspection of flexible media is performed in 3 to 5 seconds, and in 30 to 45 seconds for rigid media, depending on operating parameters. The minimum detectable defect size for rigid disks is of the order of one micrometer, and 5 to 15 micrometers for flexible disks.

Paper Details

Date Published: 19 December 1985
PDF: 8 pages
Proc. SPIE 0557, Automatic Inspection and Measurement, (19 December 1985); doi: 10.1117/12.966270
Show Author Affiliations
Pedro Lilienfeld, GCA Corporation (United States)
Sergey Broude, GCA Corporation (United States)
Eric Chase, GCA Corporation (United States)
George Quackenbos, GCA Corporation (United States)


Published in SPIE Proceedings Vol. 0557:
Automatic Inspection and Measurement
Richard A. Brook; Michael J. W. Chen, Editor(s)

© SPIE. Terms of Use
Back to Top