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Proceedings Paper

Multiprocessor Architectures for Automated Inspection Systems
Author(s): Barry Andrews
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Paper Abstract

This paper describes selected multiprocessor architectures for very high speed automated inspection systems. Traditional image processor architectures, oriented toward sequential processing, lack the throughput potential for use in high-end applications. Therefore, non-Von Neumann multiprocessor architectures are emerging as candidates for future automated inspection systems that constantly challenge the state of the art in image processing. Four processor concepts are compared and contrasted with respect to their applicability in high performance inspection systems. Each has advantages, so the selection of an appropriate architecture should be based primarily on system requirements, such as sensor data rate and format, resolution, image size, and behavior of algorithms.

Paper Details

Date Published: 19 December 1985
PDF: 6 pages
Proc. SPIE 0557, Automatic Inspection and Measurement, (19 December 1985); doi: 10.1117/12.966259
Show Author Affiliations
Barry Andrews, KLA Instruments Corporation (United States)

Published in SPIE Proceedings Vol. 0557:
Automatic Inspection and Measurement
Richard A. Brook; Michael J. W. Chen, Editor(s)

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