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Proceedings Paper

Intelligent Visual Inspection Machines
Author(s): Robert Thibadeau; John Gabrick
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Paper Abstract

Visual inspection is a common feature of manufacturing for which machines are currently illsuited. A major problem has been in bringing enough knowledge to bear on the camera input, fast enough, to be of practical value. This paper describes a machine architecture for such expert vision research in the domain of pattern inspection: in particular, the inspection of printed wiring patterns. The machine includes a powerful model of image-to-symbol transduction and a Lisp multiprocessor environment.

Paper Details

Date Published: 19 December 1985
PDF: 6 pages
Proc. SPIE 0557, Automatic Inspection and Measurement, (19 December 1985); doi: 10.1117/12.966256
Show Author Affiliations
Robert Thibadeau, Carnegie-Mellon University (United States)
John Gabrick, Carnegie-Mellon University (United States)


Published in SPIE Proceedings Vol. 0557:
Automatic Inspection and Measurement
Richard A. Brook; Michael J. W. Chen, Editor(s)

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