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Proceedings Paper

A Practical Architecture For Machine Vision Based Measurement And Inspection
Author(s): E. Panofsky; D. McGhie
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Paper Abstract

Drawing on experience gained in the design and construction of vision based workstations for measurement and inspection, utilized in industrial process and quality control, the requirements for a vision analysis system are explored. A description of an architecture for a vision system implementing these requirements is presented.

Paper Details

Date Published: 19 December 1985
PDF: 10 pages
Proc. SPIE 0557, Automatic Inspection and Measurement, (19 December 1985); doi: 10.1117/12.966255
Show Author Affiliations
E. Panofsky, Machine Intelligence Corporation (United States)
D. McGhie, Machine Intelligence Corporation (United States)

Published in SPIE Proceedings Vol. 0557:
Automatic Inspection and Measurement
Richard A. Brook; Michael J. W. Chen, Editor(s)

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