Share Email Print
cover

Proceedings Paper

Electro-Optical Terrain Reflectance Modeling: A Perspective
Author(s): J A Smith; K D Cooper; Alan H Strahler
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Electro-optical terrain reflectance modeling is one of the components required in our overall capability to simulate remote sensing measurement systems as an aid to the sensor or information processing designer. Given that sensor fields of view may vary from a few centimeters to several meters and that measurement devices may be placed at varying heights above the terrain surface, modeling of complex combinations of terrain classes or media with respect to both vertical and horizontal scales may be required. This paper addresses the issue of combining modeling approaches for different classes of materials in the optical regime and recommends a more formal approach to the radiative characterization of media properties as well as the calculation of the bidirectional reflectance distribution functions.

Paper Details

Date Published: 16 October 1984
PDF: 8 pages
Proc. SPIE 0475, Remote Sensing: Critical Review of Technology, (16 October 1984); doi: 10.1117/12.966237
Show Author Affiliations
J A Smith, Colorado State University (United States)
K D Cooper, Colorado State University (United States)
Alan H Strahler, Hunter College (United States)


Published in SPIE Proceedings Vol. 0475:
Remote Sensing: Critical Review of Technology
Philip N. Slater, Editor(s)

© SPIE. Terms of Use
Back to Top