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Proceedings Paper

A Low Noise Infrared Spot Scanner For Testing Detector Arrays
Author(s): R C Puetter; P Brissenden; J Casler; R G Hier; B Jones
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Paper Abstract

We have built a low noise spot scanner for use in testing the performance of infrared detector arrays for NASA's IR detector technology development program and the University of California's MICRO program. The scanner provides a convenient low noise detector test environment and a wide range of test conditions including versatile temperature control of the detector, ambient background, and blackbody source temperature and control of spot size, color, and brightness.

Paper Details

Date Published: 9 January 1984
PDF: 6 pages
Proc. SPIE 0445, Instrumentation in Astronomy V, (9 January 1984); doi: 10.1117/12.966143
Show Author Affiliations
R C Puetter, University of California (United States)
P Brissenden, University of California (United States)
J Casler, University of California (United States)
R G Hier, University of California (United States)
B Jones, University of California (United States)


Published in SPIE Proceedings Vol. 0445:
Instrumentation in Astronomy V
Alec Boksenberg; David L. Crawford, Editor(s)

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