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Proceedings Paper

Subpicosecond Electrical Sampling
Author(s): J. A. Valdmanis; G. Mourou; C. W. Gabel
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Paper Abstract

We report on the recent advances of an electrooptic sampling technique for the characterization of electrical transients that has now achieved a temporal resolution of .5 ps. Voltage sensitivity is on the order of 50 μV. The electrooptic material is used in a traveling wave geometry as well as in an electrodeless manner, where the electrooptic material probe the fringing field associated with the signal as it propagates along the transmission line.

Paper Details

Date Published: 28 November 1983
PDF: 7 pages
Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); doi: 10.1117/12.966086
Show Author Affiliations
J. A. Valdmanis, University of Rochester (United States)
G. Mourou, University of Rochester (United States)
C. W. Gabel, University of Rochester (United States)

Published in SPIE Proceedings Vol. 0439:
Picosecond Optoelectronics
Gerard A. Mourou, Editor(s)

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