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Proceedings Paper

Picosecond Optical Control Of Transferred Electron Devices
Author(s): T. F. Carruthers
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Paper Abstract

Examples of the use of picosecond optical pulses both as diagnostic probes and as triggering signals for transferred electron devices (TEDs) are given. The internal electric field distribution in a planar InP TED was measured with the spatial resolution of the focused beam of pulses. Domain formation in response to a triggering bias pulse is shown to require a minimum pulse duration; the bias dependence of this duration was measured for a gated GaAs TED.

Paper Details

Date Published: 28 November 1983
PDF: 8 pages
Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); doi: 10.1117/12.966070
Show Author Affiliations
T. F. Carruthers, Naval Research Laboratory (United States)


Published in SPIE Proceedings Vol. 0439:
Picosecond Optoelectronics
Gerard A. Mourou, Editor(s)

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