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Proceedings Paper

The Effect Of Overcoats On The Ablative Writing Characteristics Of Tellurium Films
Author(s): M. Chen; V. Marrello
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Paper Abstract

The change in the ablative writing sensitivity of Te films due to SiO2 and polymethyl methacrylate overcoats of various thicknesses were measured. These experimental data were compared to results of thermal calculations. We found that thermal losses of the absorbed laser energy to the overcoat layer is usually not negligible even for very thin (≤5500 Å thick) overcoat layers. In addition to thermal effects which degrade the writing sensitivity of Te films, we found that rigid overcoats combined with rigid substrates can constrain the ablative writing process of Te and hence cause further degradation in the writing sensitivity and in the read-during-write signal.

Paper Details

Date Published: 17 June 1981
PDF: 3 pages
Proc. SPIE 0263, Optical Storage Materials, (17 June 1981); doi: 10.1117/12.965678
Show Author Affiliations
M. Chen, IBM Research Laboratory (United States)
V. Marrello, IBM Research Laboratory (United States)

Published in SPIE Proceedings Vol. 0263:
Optical Storage Materials
Thomas H. DiStefano, Editor(s)

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