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Proceedings Paper

Optical Pattern Recognition And Classification Invariant To Selectable Pattern Features
Author(s): J. R. Leger; S. H. Lee
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Paper Abstract

A coherent optical method of performing pattern recognition has been studied which is invariant to selectable pattern features. Two examples of pattern features frequently encountered in pattern recognition tasks are scale and rotation. A recognition scheme which is invariant to these features is able to detect an object independent of its size and angular orientation. In our case, the recognition scheme not only is invariant to these specific features, but can also be used to measure them.

Paper Details

Date Published: 4 December 1979
PDF: 2 pages
Proc. SPIE 0201, Optical Pattern Recognition, (4 December 1979); doi: 10.1117/12.965620
Show Author Affiliations
J. R. Leger, University of California San Diego (United States)
S. H. Lee, University of California San Diego (United States)


Published in SPIE Proceedings Vol. 0201:
Optical Pattern Recognition
David P. Casasent, Editor(s)

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