Proceedings Paper
An Automatic Fringe Analysis Interferometer For Rapid Moire Stress Analysis| Format | Member Price | Non-Member Price |
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Paper Abstract
In optical methods of stress analysis, the reduction of raw data to engineering quantities has proved to be a difficult problem. A portable instrument has been developed which interrogates a specimen grid point-wise using a narrow beam of coherent light, and electro-optically measures interference-fringe-spacing, in three directions simultaneously. A microprocessor is incorporated to convert the strain component values to convenient quantities such as principal stress and shear, and these are displayed. The read-rate is adjustable up to 5 kHz, the discrimination level is 4 µε, and a facility for temperature compensation is included. The logic behind the design of the major features of the unit are described.
Paper Details
Date Published: 25 July 1979
PDF: 14 pages
Proc. SPIE 0164, 4th European Electro-Optics Conf, (25 July 1979); doi: 10.1117/12.965515
Published in SPIE Proceedings Vol. 0164:
4th European Electro-Optics Conf
PDF: 14 pages
Proc. SPIE 0164, 4th European Electro-Optics Conf, (25 July 1979); doi: 10.1117/12.965515
Show Author Affiliations
J. McKelvie, University of Strathclyde (Scotland)
D. Pritty, University of Strathclyde (Scotland)
D. Pritty, University of Strathclyde (Scotland)
C. A. Walker, University of Strathclyde (Scotland)
Published in SPIE Proceedings Vol. 0164:
4th European Electro-Optics Conf
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