Share Email Print
cover

Proceedings Paper

An Automatic Fringe Analysis Interferometer For Rapid Moire Stress Analysis
Author(s): J. McKelvie; D. Pritty; C. A. Walker
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In optical methods of stress analysis, the reduction of raw data to engineering quantities has proved to be a difficult problem. A portable instrument has been developed which interrogates a specimen grid point-wise using a narrow beam of coherent light, and electro-optically measures interference-fringe-spacing, in three directions simultaneously. A microprocessor is incorporated to convert the strain component values to convenient quantities such as principal stress and shear, and these are displayed. The read-rate is adjustable up to 5 kHz, the discrimination level is 4 µε, and a facility for temperature compensation is included. The logic behind the design of the major features of the unit are described.

Paper Details

Date Published: 25 July 1979
PDF: 14 pages
Proc. SPIE 0164, 4th European Electro-Optics Conf, (25 July 1979); doi: 10.1117/12.965515
Show Author Affiliations
J. McKelvie, University of Strathclyde (Scotland)
D. Pritty, University of Strathclyde (Scotland)
C. A. Walker, University of Strathclyde (Scotland)


Published in SPIE Proceedings Vol. 0164:
4th European Electro-Optics Conf

© SPIE. Terms of Use
Back to Top