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Proceedings Paper

Simultaneously Time- And Space-Resolved Spectroscopic Characterization Of Laser-Produced Plasmas
Author(s): G Charatis; B.K. F Young; Gar E Busch; C J Cerjan; VV H Goldstein; A L Osterheld; T W Phillips; M D Rosen; R E Stewart; R S Walling
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Paper Abstract

The CHROMA laser facility at KMS Fusion has been used to irradiate a variety of microdot targets. These include aluminum dots and mixed bromine dots doped with K-shell (magnesium) emitters. Simultaneously time-and space-resolved K-shell and L-shell spectra have been measured and compared to dynamic model predictions. The electron density profiles are measured using holographic interferometry. Temperatures, densities, and ionization distributions are determined using K-shell and L-shell spectral techniques. Time and spatial gradients are resolved simultaneously using three diagnostics: a framing crystal x-ray spectrometer, an x-ray streaked crystal spectrometer with a spatial imaging slit, and a 4-frame holographic interferometer. Significant differences have been found between the interferometric and the model-dependent spectral measurements of plasma density. Predictions by new non-stationary L-shell models currently being developed are also presented.

Paper Details

Date Published: 11 July 1988
PDF: 6 pages
Proc. SPIE 0913, High Intensity Laser-Matter Interactions, (11 July 1988); doi: 10.1117/12.965134
Show Author Affiliations
G Charatis, KMS Fusion, Inc. (United States)
B.K. F Young, University of California (United States)
Gar E Busch, KMS Fusion, Inc. (United States)
C J Cerjan, University of California (United States)
VV H Goldstein, University of California (United States)
A L Osterheld, University of California (United States)
T W Phillips, University of California (United States)
M D Rosen, University of California (United States)
R E Stewart, University of California (United States)
R S Walling, University of California-Davis (United States)


Published in SPIE Proceedings Vol. 0913:
High Intensity Laser-Matter Interactions
Hector A. Baldis; E. Michael Campbell, Editor(s)

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