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Proceedings Paper

NATO Radiation Effects Test Program For Optical Fibers And Components
Author(s): Peter B Lyons; C A Barnes; E J Friebele; R Gilbert; R Greenwell; H Henschel; A Johan; L D Looney; J A Wall; F Pamnalone; W Schneider; G Sigel; D Smith; A Spencer; E Taylor; G. Turquet de Beauregard
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Paper Abstract

Telecommunications has provided the primary impetus for the explosive growth in fiber-optics technologies over the last decade. However, although standard telecommunications is the largest volume-user of optical fibers, other applications that exploit the unique attributes of photonics systems are becoming increasingly prominent. Many of these systems require that the fiber properties remain acceptable while exposed to a challenging variety of adverse environments. Many of these environments include exposure to ionizing radiation. Radiation-induced modifications to optical materials have been studied for several decades, so it was to be anticipated that such effects would be present in optical fibers. Many papers and several comprehensive reviews",3,4 have been devoted to better understand-ing of such phenomena.

Paper Details

Date Published: 8 June 1988
PDF: 15 pages
Proc. SPIE 0867, Optical Devices in Adverse Environments, (8 June 1988); doi: 10.1117/12.965062
Show Author Affiliations
Peter B Lyons, Los Alamos National Laboratory (United States)
C A Barnes, Aerospace Corporation (United States)
E J Friebele, Naval Research Laboratory (United States)
R Gilbert, Harry Diamond Laboratories (United States)
R Greenwell, Science & Engineering Associates (United States)
H Henschel, Fraunhofer-INT (Germany)
A Johan, DRET/ETCA/CEG (France)
L D Looney, Los Alamos National Laboratory (United States)
J A Wall, RADC /ESR (United States)
F Pamnalone, DRET/ETCA/NTCO (France)
W Schneider, MBB Hubschrauber and Flugzeuge (Germany)
G Sigel, Rutgers University (United States)
D Smith, Lawrence Livermore National Laboratory (United States)
A Spencer, MOD (PE)/DCVD (UK)
E Taylor, AFWL/NTCOO (United States)
G. Turquet de Beauregard, CEA/CEM (France)

Published in SPIE Proceedings Vol. 0867:
Optical Devices in Adverse Environments
Roger A. Greenwell, Editor(s)

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