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Proceedings Paper

Multilayer Theory Of X-Ray Reflection
Author(s): P. G. Harper; S. K. Ramchurn
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Paper Abstract

A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 x 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.

Paper Details

Date Published: 1 January 1986
PDF: 9 pages
Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); doi: 10.1117/12.964928
Show Author Affiliations
P. G. Harper, Heriot-Watt University (Scotland)
S. K. Ramchurn, Heriot-Watt University (Scotland)

Published in SPIE Proceedings Vol. 0733:
Soft X-Ray Optics and Technology
E. Koch; Guenther A. Schmahl, Editor(s)

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