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Proceedings Paper

Studies of interfacial structure in WC multilayers
Author(s): Ashley Fuller; Roman Tatchyn; Paul Csonka; Ingolf Lindau
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Paper Abstract

This paper reports on a set of interfacial structure studies in WC multilayers. Statistical investigations were conducted to ascertain whether building up layers containing, on the average, an integer number of atoms could in any way minimize the effects of interfacial roughness.

Paper Details

Date Published: 1 January 1986
PDF: 8 pages
Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); doi: 10.1117/12.964923
Show Author Affiliations
Ashley Fuller, Stanford University (United States)
Roman Tatchyn, Stanford University and University of Oregon (United States)
Paul Csonka, University of Oregon (United States)
Ingolf Lindau, Stanford University (United States)


Published in SPIE Proceedings Vol. 0733:
Soft X-Ray Optics and Technology
E. Koch; Guenther A. Schmahl, Editor(s)

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