Share Email Print

Proceedings Paper

X-Ray Measurements For The Determination Of Extension And Divergence Of Electron Beams In Storage Rings
Author(s): F. Riehle; E. Tegeler; B. Wende
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Methods are presented for the determination of the vertical extension and divergence of electron beams in storage rings which also allow to obtain the vertical emittance. The ver-tical extension of the electron beam of the storage ring BESSY was measured with an X-ray slit camera. The vertical divergence was derived from the vertical angular distribution of the synchrotron radiation of the storage ring measured with either an X-ray polarimeter or an energy dispersive X-ray photon counter.

Paper Details

Date Published: 1 January 1986
PDF: 6 pages
Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); doi: 10.1117/12.964895
Show Author Affiliations
F. Riehle, Institut Berlin (Germany)
E. Tegeler, Institut Berlin (Germany)
B. Wende, Institut Berlin (United States)

Published in SPIE Proceedings Vol. 0733:
Soft X-Ray Optics and Technology
E. Koch; Guenther A. Schmahl, Editor(s)

© SPIE. Terms of Use
Back to Top