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Proceedings Paper

X-Ray Measurements For The Determination Of Extension And Divergence Of Electron Beams In Storage Rings
Author(s): F. Riehle; E. Tegeler; B. Wende
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Paper Abstract

Methods are presented for the determination of the vertical extension and divergence of electron beams in storage rings which also allow to obtain the vertical emittance. The ver-tical extension of the electron beam of the storage ring BESSY was measured with an X-ray slit camera. The vertical divergence was derived from the vertical angular distribution of the synchrotron radiation of the storage ring measured with either an X-ray polarimeter or an energy dispersive X-ray photon counter.

Paper Details

Date Published: 1 January 1986
PDF: 6 pages
Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); doi: 10.1117/12.964895
Show Author Affiliations
F. Riehle, Institut Berlin (Germany)
E. Tegeler, Institut Berlin (Germany)
B. Wende, Institut Berlin (United States)


Published in SPIE Proceedings Vol. 0733:
Soft X-Ray Optics and Technology
E. Koch; Guenther A. Schmahl, Editor(s)

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