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Proceedings Paper

X-UV Spectral Analysis Using a Double Flat-Multilayer Monochromator
Author(s): R. Marmoret; I. Mosnier-Thoumas; M. Pirocchi; R. Barchewitz; J. Susini; R. Rivoira; R. Philip
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Paper Abstract

A new apparatus designed to measure the quality of X-ray and X-UV dispersive devices of synchrotron radiation in the range 5000-50 eV is described. It consists of a double mirror high-frequency rejector, a constant deviation double crystal monochromator and a spectrogoniometer θ-2θ. The monochromator and the spectrogoniometer can be equipped with natural and artificial crystals or with multilayer interferential mirrors (MIMs). Absolute measurements of transmission for thin screens can be made, as well as reflectance for mirrors or MIMs. So, it is possible to determine optical constants particularly in anomalous regions. In the same way XANES, EXAFS, ref EXAFS, surface roughness, .... measurements can be achieved. In this paper we present the first results obtained by using beryl crystals and MIMs near 1000 eV.

Paper Details

Date Published: 9 April 1987
PDF: 9 pages
Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); doi: 10.1117/12.964842
Show Author Affiliations
R. Marmoret, Centre d'Etudes Nucleaires de Bruyeres-Le-Chatel (France)
I. Mosnier-Thoumas, Centre d'Etudes Nucleaires de Bruyeres-Le-Chatel (France)
M. Pirocchi, Universite Pierre et Marie Curie (France)
University Paris Sud (France)
R. Barchewitz, Universite Pierre et Marie Curie (France)
University Paris Sud (France)
J. Susini, Universite Pierre et Marie Curie (France)
University Paris Sud (France)
R. Rivoira, Universite d'Aix-Marseille III (France)
R. Philip, Universite d'Aix-Marseille III (France)


Published in SPIE Proceedings Vol. 0688:
Multilayer Structures & Laboratory X-Ray Laser Research
Natale M. Ceglio; Pierre Dhez, Editor(s)

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